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Silicon Valley Test Conference

Call for Presentations

Silicon Valley Test Workshop 2012 is dedicated to electronic test of devices, covering the complete cycle from design verification, silicon debug, manufacturing test, system test and failure analysis. At SVTW, test and yield professionals can confront the challenges the industry faces and learn how these challenges are being addressed by the efforts of design tool and equipment suppliers, and test engineers.

The goal of the Workshop is to create an informal forum to discuss emerging and innovative test methods and hardware solutions that meet the challenges of reducing cost of test and time-to-volume pressures. We are inviting proposals and ideas for presentation which are interesting to our engineering community.

Authors are invited to submit presentation proposals. The proposals may be draft presentations, extended abstracts (500 words), describing recent work in the field of test and test development or test design. Each podium presentation should be 30 minutes in length.

Submissions must include:

  • Title of presentation
  • Name, affiliation, mailing address, e-mail address and phone number of each author
  • Designation of the presenter. SVTest will communicate with the presenter
  • Description of your topic
  • One electronic copy of a complete presentation, draft presentation or extended abstract

Presentation Submission Deadline: May 15, 212
Author Notification: June 1, 2012
Manuscript due: August 1, 2012

Send Presentation Proposal to: nicksvtc@gmail.com or SVTest, PO Box 2457, Cupertino, CA 95015

Conference Focus Topics

  • Test and Design for Manufacturability
  • Yield Analysis and Optimization
  • Low Cost Test
  • High Speed I/O and RF Test
  • Probe-Card Design and Innovation
  • Interface Hardware and Simulation
  • Design Verification & Validation
  • PDN implications for Testing & Validation
  • Adaptive Test
  • Integrated RF Testing
  • Load Board and Socketing Issues
  • Multi-Site Test
  • SiP and KGD Test
  • Analog & Mixed Signal Test

For Further information contact:

General Chair: Nick Langston (nicksvtc@gmail.com)
Program Chair: Matthias Kamm (matthias@cisco.com)