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Silicon Valley 2012 Test Workshop

The only Workshop on Semiconductor Testing in Silicon Valley

The Silicon Valley Test Workshop for 2011 is in the books as a great little conference. You can read a summary about the conference at www.ateforum.com or a complete review of the conference at Ira Feldmans blog here: http://hightechbizdev.com/2011/11/28/ira-feldman-high-technology-business-development-silicon-valley-test-workshop-2nd-year-rocks/#more-652. The conference had a very strong theme on Signal Integrity in test board interfaces.

Mentor your peers and get your presentation ready!

The SVTest event focuses on all the aspects associated with wafer and packaged die characterization, debug, final test and failure analysis. The conference is organized in 2 separate tracks; The first track is organized around the improved use of Test Techniques & Methods to improve the accuracy and reduce the time to bring a product to volume production.

This includes RF, Analog& Mixed Signal products along with Digital devices. The second track is focused on the hardware and interface of the DUT to the Test Stimulus and Measurement systems. This track includes Probe Cards, ATE boards, calibration methods, test sockets etc.

The conference is soliciting a mixture of manufacturer and vendor presentations which can present innovative Test Techniques and Tools that will make your job easier and you more efficient. This is a low key and relaxed conference with emphasis on current problems and solutions and minimum of academic or theoretical approaches. We are encouraging plenty of informal discussion and debate and social networking with your peers.